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Genome-wide association mapping reveals novel sources of resistance to northern corn leaf blight in maize
Ding, Junqiang, Ali, Farhan, Chen, Gengshen, Li, Huihui, Mahuku, George, Yang, Ning, Narro, Luis, Magorokosho, Cosmos, Makumbi, Dan, Yan, JianbingVolume:
15
Langue:
english
Journal:
BMC Plant Biology
DOI:
10.1186/s12870-015-0589-z
Date:
December, 2015
Fichier:
PDF, 1.38 MB
english, 2015