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SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, California, United States (Sunday 17 August 2014)] Nanoimaging and Nanospectroscopy II - Residual pesticide detection on food with particle-enhanced Raman scattering
Verma, Prabhat, Egner, Alexander, Ranjan, Bikas, Huang, LiChuan, Masui, Kyoko, Saito, Yuika, Verma, PrabhatVolume:
9169
Année:
2014
Langue:
english
DOI:
10.1117/12.2060775
Fichier:
PDF, 568 KB
english, 2014