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[IEEE 2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity - Santa Clara, CA, USA (2015.3.15-2015.3.21)] 2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity - Comparison of TRL calibration vs. 2x thru de-embedding methods
Moon, Se-Jung, Ye, Xiaoning, Smith, RexAnnée:
2015
Langue:
english
DOI:
10.1109/EMCSI.2015.7107681
Fichier:
PDF, 1.05 MB
english, 2015