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Effects of Si δ -Doping Condition and Growth Interruption on Electrical Properties of InP-Based High Electron Mobility Transistor Structures
Zhou, Shu-Xing, Qi, Ming, Ai, Li-Kun, Xu, An-Huai, Wang, Li-Dan, Ding, Peng, Jin, ZhiVolume:
32
Langue:
english
Journal:
Chinese Physics Letters
DOI:
10.1088/0256-307X/32/9/097101
Date:
September, 2015
Fichier:
PDF, 1.16 MB
english, 2015