Direct sampling of electric-field vacuum fluctuations
Riek, C., Seletskiy, D. V., Moskalenko, A. S., Schmidt, J. F., Krauspe, P., Eckart, S., Eggert, S., Burkard, G., Leitenstorfer, A.Langue:
english
Journal:
Science
DOI:
10.1126/science.aac9788
Date:
October, 2015
Fichier:
PDF, 1.08 MB
english, 2015