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Accurate new methodology in scanning thermal microscopy
Saci, Abdelhak, Battaglia, Jean-Luc, De, IndryaushAnnée:
2015
Langue:
english
Journal:
IEEE Transactions on Nanotechnology
DOI:
10.1109/TNANO.2015.2476339
Fichier:
PDF, 1.50 MB
english, 2015