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How low can STED go? Comparison of different write-erase beam combinations for stimulated emission depletion microscopy
Khonina, Svetlana N., Golub, IlyaVolume:
29
Langue:
english
Journal:
Journal of the Optical Society of America A
DOI:
10.1364/josaa.29.002242
Date:
October, 2012
Fichier:
PDF, 1.17 MB
english, 2012