
[IEEE 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Hong Kong, China (2015.5.10-2015.5.14)] 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Self-heating enhanced HCI degradation in pLDMOSFETs
He, Yandong, Zhang, Ganggang, Zhang, XingAnnée:
2015
Langue:
english
DOI:
10.1109/ISPSD.2015.7123473
Fichier:
PDF, 319 KB
english, 2015