SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 1 August 2010)] Developments in X-Ray Tomography VII - Determination of strain fields in porous shape memory alloys using micro-computed tomography
Stock, Stuart R., Bormann, Therese, Friess, Sebastian, de Wild, Michael, Schumacher, Ralf, Schulz, Georg, Müller, BertVolume:
7804
Année:
2010
Langue:
english
DOI:
10.1117/12.861386
Fichier:
PDF, 3.02 MB
english, 2010