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[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - CpK approach for the qualification of ECC-designs with single bit failures
Tempel, GeorgAnnée:
2015
Langue:
english
DOI:
10.1109/IRPS.2015.7112765
Fichier:
PDF, 487 KB
english, 2015