[IEEE 2014 10th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM) - Smolenice, Slovakia (2014.10.20-2014.10.22)] The Tenth International Conference on Advanced Semiconductor Devices and Microsystems - Application of real time in-situ interferometry for the observation of GaN/Si MOVPE growth process
Szymanski, T., Wosko, M., Paszkiewicz, B., Indykiewicz, K., Paszkiewicz, R.Année:
2014
Langue:
english
DOI:
10.1109/asdam.2014.6998650
Fichier:
PDF, 321 KB
english, 2014