[IEEE 2014 10th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM) - Smolenice, Slovakia (2014.10.20-2014.10.22)] The Tenth International Conference on Advanced Semiconductor Devices and Microsystems - Analysis of detection properties of particle detectors based on 4H-SiC high quality epitaxial layer
Zat'ko, B., Dubecky, F., Sedlackova, K., Sagatova, A., Bohacek, P., Sekacova, M., Necas, V.Année:
2014
Langue:
english
DOI:
10.1109/asdam.2014.6998647
Fichier:
PDF, 101 KB
english, 2014