
SPIE Proceedings [SPIE Electronic Imaging 2004 - San Jose, CA (Sunday 18 January 2004)] Three-Dimensional Image Capture and Applications VI - Real metrology by using depth map information
Ardizzone, Edoardo, Battiato, Sebastiano, Capra, Alessandro, Curti, Salvatore, Corner, Brian D., Li, Peng, Pargas, Roy P.Volume:
5302
Année:
2004
Langue:
english
DOI:
10.1117/12.526596
Fichier:
PDF, 451 KB
english, 2004