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[IEEE 2014 International Semiconductor Laser Conference (ISLC) - Palma de Mallorca, Spain (2014.9.7-2014.9.10)] 2014 International Semiconductor Laser Conference - Characterization of emission regimes in a 1.5 µm high brightness
Vilera, M., Tijero, J.M.G., Aguilera, S., Adamiec, P., Consoli, A., Esquivias, I.Année:
2014
Langue:
english
DOI:
10.1109/ISLC.2014.213
Fichier:
PDF, 391 KB
english, 2014