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Electronic structures of TPD/metal interfaces studied by photoemission and Kelvin probe method
Eisuke Ito, Hiroshi Oji, Naoki Hayashi, Hisao Ishii, Yukio Ouchi, Kazuhiko SekiVolume:
175-176
Année:
2001
Langue:
english
Pages:
5
DOI:
10.1016/s0169-4332(01)00088-5
Fichier:
PDF, 100 KB
english, 2001