Correlation between interface state properties and electron transport at ultrathin insulator/Si interfaces
Tatsuo Shiozawa, Toshiyuki Yoshida, Tamotsu Hashizume, Hideki HasegawaVolume:
159-160
Année:
2000
Langue:
english
Pages:
6
DOI:
10.1016/s0169-4332(00)00068-4
Fichier:
PDF, 197 KB
english, 2000