[IEEE 2014 IEEE Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Knoxville, TN, USA (2014.10.13-2014.10.15)] 2014 IEEE Workshop on Wide Bandgap Power Devices and Applications - Degradation mechanisms of AlGaN/GaN HEMTs on sapphire, Si, and SiC substrates under proton irradiation
Koehler, Andrew D., Anderson, Travis J., Hite, Jennifer K., Weaver, Bradley D., Tadjer, Marko J., Mastro, Michael A., Greenlee, Jordan D., Specht, Petra, Porter, Matthew, Weatherford, Todd R., Hobart,Année:
2014
Langue:
english
DOI:
10.1109/WiPDA.2014.6964619
Fichier:
PDF, 1.79 MB
english, 2014
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