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SPIE Proceedings [SPIE SPECKLE 2015: VI International Conference on Speckle Metrology - Guanajuato, Mexico (Monday 24 August 2015)] SPECKLE 2015: VI International Conference on Speckle Metrology - Instantaneous phase-shifting Fizeau interferometry with high-speed pixelated phase-mask camera
Torres, Annette T., Mendoza Santoyo, Fernando, Mendez, Eugenio R., Yatagai, Toyohiko, Jackin, Boaz Jessie, Ono, Akira, Kiyohara, Kosuke, Noguchi, Masato, Yoshii, Minoru, Kiyohara, Motosuke, Niwa, HayaVolume:
9660
Année:
2015
Langue:
english
DOI:
10.1117/12.2196420
Fichier:
PDF, 209 KB
english, 2015