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[ACM Press the 2008 ACM symposium - Fortaleza, Ceara, Brazil (2008.03.16-2008.03.20)] Proceedings of the 2008 ACM symposium on Applied computing - SAC '08 - A detectability analysis of fault classes for Boolean specifications
Chen, Zhenyu, Xu, Baowen, Nie, ChanghaiAnnée:
2008
Langue:
english
DOI:
10.1145/1363686.1363874
Fichier:
PDF, 231 KB
english, 2008