[IEEE 2015 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP) - Montpellier, France (2015.4.27-2015.4.30)] 2015 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP) - Fracture mechanism analysis for stealth dicing applied in wafer expansion
Chuang, Wan-Chun, Tu, Wei-Hsiang, Lin, Guan-shian, Hwang, Jeong-Yuan, Lee, Chin-SungAnnée:
2015
Langue:
english
DOI:
10.1109/DTIP.2015.7161040
Fichier:
PDF, 337 KB
english, 2015