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Sensitivity analyses of the thermophysical properties of silicon melt and crystal
Mito, Mitsumasa, Tsukada, Takao, Hozawa, Mitsunori, Yokoyama, Chiaki, Li, You-Rong, Imaishi, NobuyukiVolume:
16
Langue:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/0957-0233/16/2/018
Date:
February, 2005
Fichier:
PDF, 656 KB
english, 2005