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[IEEE 2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity - Santa Clara, CA, USA (2015.3.15-2015.3.21)] 2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity - Quality assurance of S-parameters and rational function models for transient simulations
Kim, Sanghoek, Romo Luevano, Gerardo, Roselle, Kevin, Michalka, TimAnnée:
2015
Langue:
english
DOI:
10.1109/EMCSI.2015.7107656
Fichier:
PDF, 1.03 MB
english, 2015