
Reverse Engineering of Integrated Circuits using Cross-Sectional Transmission Electron Microscopy—A Morphological and Structural Study
Bharadwaj, L M, Gantcheva, V, Simov, S, Balossier, G, Faure, J, Bonhomme, P, Kumar, Parshant, Bajpai, R PVolume:
15
Langue:
english
Journal:
IETE Technical Review
DOI:
10.1080/02564602.1998.11416726
Date:
January, 1998
Fichier:
PDF, 3.18 MB
english, 1998