Study of Randomly Distributed Charge Traps by Measuring Frequency- and Time-Dependence of a DNTT-Based MIS Capacitor
Hayashi, Toshiaki, Take, Naoya, Nakano, Hayato, Fujiwara, Akira, Sekitani, Tsuyoshi, Someya, TakaoVolume:
11
Langue:
english
Journal:
Journal of Display Technology
DOI:
10.1109/jdt.2015.2419274
Date:
July, 2015
Fichier:
PDF, 1.19 MB
english, 2015