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[IEEE 30th European Solid-State Device Research Conference - Cork, Ireland (2000.9.11-2000.9.13)] 30th European Solid-State Device Research Conference - Narrow Device Issues in Deep-Submicron Technologies-the Influence of Stress, TED and Segregation on Device Performance
Nouri, F., Scott, G., Rubin, M., Manley, M., Stolk, P.Année:
2000
Langue:
english
DOI:
10.1109/essderc.2000.194727
Fichier:
PDF, 367 KB
english, 2000