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Modeling interface-controlled phase transformation kinetics in thin films
Pang, E. L., Vo, N. Q., Philippe, T., Voorhees, P. W.Volume:
117
Langue:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4919725
Date:
May, 2015
Fichier:
PDF, 1.64 MB
english, 2015