Reliability analysis for the competing failure with probabilistic failure threshold value and its application to thek-out-of-nsystems
Yuan, Rong, Li, Hai-qing, He, Li-ping, Gao, Hui-yingVolume:
20
Langue:
english
Journal:
Journal of Shanghai Jiaotong University (Science)
DOI:
10.1007/S12204-015-1657-0
Date:
August, 2015
Fichier:
PDF, 526 KB
english, 2015