Study on Adhesive Strength between Ge 2 Sb 2 Te 5 Film and Electrodes for Phase Change Memory Application
Liu, Yanbo, Zhang, Ting, Zhang, Guoxin, Niu, Xiaoming, Song, Zhitang, Min, Guoquan, Lin, Yun, Zhang, Jing, Zhou, Weimin, Zhang, Jianping, Chu, Jiangtao, Wan, YongZhong, Feng, SonglinVolume:
48
Langue:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.48.101601
Date:
October, 2009
Fichier:
PDF, 1.01 MB
english, 2009
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