Test Method for Electronic Device on Condition of Small Sampling
Cheng, Ze, Xuan, Zhao Long, Wang, Wei, Hao, Mao SenVolume:
347-350
Langue:
english
Journal:
Applied Mechanics and Materials
DOI:
10.4028/www.scientific.net/AMM.347-350.525
Date:
August, 2013
Fichier:
PDF, 271 KB
english, 2013