SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Advances in X-Ray/EUV Optics and Components IX - The effect of unequal bilayer thickness on stress in WSi 2 /Si multilayers for multilayer Laue Lens structures
Morawe, Christian, Khounsary, Ali M., Goto, Shunji, Shi, Bing, Macrander, Albert T., Maser, Jörg, Conley, Raymond, Assoufid, LahsenVolume:
9207
Année:
2014
Langue:
english
DOI:
10.1117/12.2061869
Fichier:
PDF, 572 KB
english, 2014