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Optical Characterization of Lattice Damage and Recovery in Ion-Implanted and Pulsed Excimer Laser Irradiated 4H-SiC
Sands, D., Key, P.H., Schlaf, M., Walton, C.D., Anthony, C.J., Uren, Michael J.Volume:
338-342
Année:
2000
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.338-342.655
Fichier:
PDF, 334 KB
2000