New Method of Fault Knowledge Acquisition of Electronic Equipment
Huo, Zhi Cheng, Sun, Qi Shun, Qi, Feng Jun, Ding, Guo BaoVolume:
496-500
Langue:
english
Journal:
Applied Mechanics and Materials
DOI:
10.4028/www.scientific.net/AMM.496-500.931
Date:
January, 2014
Fichier:
PDF, 231 KB
english, 2014