Probe microanalysis investigation and electroreflectance spectroscopy of Hg1−xCdxTe PLD films on silicon patterned substrates
T.Ya Gorbach, L.A Matveeva, P.S Smertenko, S.V Svechnikov, E.F Venger, M Kuzma, G Wisz, R Ciach, A RakowskaVolume:
380
Année:
2000
Langue:
english
Pages:
3
DOI:
10.1016/s0040-6090(00)01518-2
Fichier:
PDF, 1.09 MB
english, 2000