EFFECTS OF NITROGEN INCORPORATION IN LANTHANUM-BASED DIELECTRIC FILMS
Edon, V., Hugon, M.-C., Agius, B., Bastos, K. P., Miotti, L., Driemeier, C., Salvador, L., Krug, C., Baumvol, I. J. R., Eypert, C., Durand, O.Volume:
97
Langue:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584580802088991
Date:
June, 2008
Fichier:
PDF, 1.73 MB
english, 2008