The operation of 0.35 μm partially depleted SOI CMOS technology in extreme environments
Ying Li, Guofu Niu, John D. Cressler, Jagdish Patel, S.T. Liu, Robert A. Reed, Mohammad M. Mojarradi, Benjamin J. BlalockVolume:
47
Année:
2003
Langue:
english
Pages:
5
DOI:
10.1016/s0038-1101(02)00516-6
Fichier:
PDF, 277 KB
english, 2003