Four different approaches for the measurement of IC surface temperature: application to thermal testing
Josep Altet, Stefan Dilhaire, Sebastian Volz, Jean-Michel Rampnoux, Antonio Rubio, Stephane Grauby, Luis David Patino Lopez, Wilfrid Claeys, Jean-Bernard SaulnierVolume:
33
Année:
2002
Langue:
english
Pages:
8
DOI:
10.1016/s0026-2692(02)00051-4
Fichier:
PDF, 500 KB
english, 2002