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[IEEE 2014 IEEE International Symposium on Electromagnetic Compatibility - EMC 2014 - Raleigh, NC, USA (2014.8.4-2014.8.8)] 2014 IEEE International Symposium on Electromagnetic Compatibility (EMC) - Integrated-circuit countermeasures against information leakage through EM radiation
Miura, Noriyuki, Fujimoto, Daisuke, Hayashi, Yu-ichi, Homma, Naofumi, Aoki, Takafumi, Nagata, MakotoAnnée:
2014
Langue:
english
DOI:
10.1109/ISEMC.2014.6899068
Fichier:
PDF, 1010 KB
english, 2014