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The Impact of Drain-Induced Barrier Lowering Effect on Threshold Voltage for Small-Scaled Strained Si/SiGe nMOSFET
Qu, Jiang Tao, Zhang, He Ming, Hu, Hui Yong, Xu, Xiao Bo, Wang, Guan Yu, Wang, Xiao YanVolume:
110-116
Langue:
english
Journal:
Applied Mechanics and Materials
DOI:
10.4028/www.scientific.net/amm.110-116.5457
Date:
October, 2011
Fichier:
PDF, 331 KB
english, 2011