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Thermal behavior of He-irradiation-induced defects in silicon
Yoshitaka Nakano, Masayasu Ishiko, Hiroshi Tadano, Uwe Myler, Peter SimpsonVolume:
210
Année:
2000
Langue:
english
Pages:
5
DOI:
10.1016/s0022-0248(99)00651-x
Fichier:
PDF, 203 KB
english, 2000