In situ visualization and analysis of silicon carbide physical vapor transport growth using digital X-ray imaging
P.J Wellmann, M Bickermann, D Hofmann, L Kadinski, M Selder, T.L Straubinger, A WinnackerVolume:
216
Année:
2000
Langue:
english
Pages:
10
DOI:
10.1016/s0022-0248(00)00372-9
Fichier:
PDF, 457 KB
english, 2000