SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Tuesday 13 May 1997)] Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997 - Use of photodepolarization spectra for diagnostics and characterization of alternating current thin-film electroluminescent (ACTFEL) devices
Vlasenko, Nataliya A., Beletskii, A. I., Denisova, Z. L., Kononets, Ya. F., Veligura, L. I., Svechnikov, Sergey V., Valakh, Mikhail Y.Volume:
3359
Année:
1998
Langue:
english
DOI:
10.1117/12.306271
Fichier:
PDF, 531 KB
english, 1998
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