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Measurements of Matching and Noise Performance of a Prototype Readout Chip in 40 nm CMOS Process for Hybrid Pixel Detectors
Maj, P., Grybos, P., Szczygiel, R., Kmon, P., Kleczek, R., Drozd, A., Otfinowski, P., Deptuch, G.Volume:
62
Langue:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2014.2385595
Date:
February, 2015
Fichier:
PDF, 1.70 MB
english, 2015