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Amorphous Ni–Zr layer applied for microstructure improvement of Ni-based ohmic contacts to SiC
Wzorek, M., Czerwinski, A., Borysiewicz, M.A., Gołaszewska, K., Myśliwiec, M., Ratajczak, J., Piotrowska, A., Kątcki, J.Volume:
199
Langue:
english
Journal:
Materials Science and Engineering: B
DOI:
10.1016/j.mseb.2015.04.012
Date:
September, 2015
Fichier:
PDF, 2.63 MB
english, 2015