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In situ surface X-ray diffraction studies of electrochemical interfaces at a high-energy third-generation synchrotron facility
V.H. Etgens, M.C. Martins Alves, A. TadjeddineVolume:
45
Année:
1999
Langue:
english
Pages:
9
DOI:
10.1016/s0013-4686(99)00237-6
Fichier:
PDF, 368 KB
english, 1999