SPIE Proceedings [SPIE Optical Systems Design 2005 - Jena, Germany (Monday 12 September 2005)] Advances in Optical Thin Films II - High reflectivity measurement with cavity ring-down technique
Gao, Li-feng, Xiong, Sheng-ming, Li, Bin-cheng, Zhang, Yong-dong, Amra, Claude, Kaiser, Norbert, Macleod, H. AngusVolume:
5963
Année:
2005
Langue:
english
DOI:
10.1117/12.627774
Fichier:
PDF, 185 KB
english, 2005