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SPIE Proceedings [SPIE Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments - Beijing, China (Wednesday 8 November 2000)] Process Control and Inspection for Industry - Pulsed laser/background light simulator
Yang, Yi, Ni, Xuxiang, Lu, Zukang, Ding, Xiancheng, Zhang, Shulian, Gao, WeiVolume:
4222
Année:
2000
Langue:
english
DOI:
10.1117/12.403893
Fichier:
PDF, 221 KB
english, 2000