SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Design of null tests for an F/0.8 concave oblate elliptical surface
Ding, Xuezhuan, Yang, Bo, Liu, Chenglin, Wang, Xin, Liu, Yinnian, Zhang, Yudong, Sasián, José, Xiang, Libin, To, SandyVolume:
7656
Année:
2010
Langue:
english
DOI:
10.1117/12.864876
Fichier:
PDF, 207 KB
english, 2010