In Situ X-Ray Reflectivity Study of Imprint in Ferroelectric Thin Films
Cao, Jiang Li, Zhang, Kai, Solbach, Axel, Yue, Zhen Xing, Wang, Huang Hua, Chen, Yu, Klemradt, UweVolume:
687
Langue:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.687.292
Date:
June, 2011
Fichier:
PDF, 419 KB
english, 2011