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Effects of stress conditions on the generation of negative bias temperature instability-associated interface traps
Zhang, Yue, Pu, Shi, Lei, Xiao-Yi, Chen, Qing, Ma, Xiao-Hua, Hao, YueVolume:
22
Langue:
english
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/22/11/117311
Date:
November, 2013
Fichier:
PDF, 678 KB
english, 2013