Unsupervised image processing scheme for transistor photon emission analysis in order to identify defect location
Chef, Samuel, Jacquir, Sabir, Sanchez, Kevin, Perdu, Philippe, Binczak, StéphaneVolume:
24
Langue:
english
Journal:
Journal of Electronic Imaging
DOI:
10.1117/1.JEI.24.1.013019
Date:
January, 2015
Fichier:
PDF, 5.49 MB
english, 2015